Keyence VR 5200 wide-area 3D measurement system and Taylor Hobson CCI HD Optical Profiler

The Keyence VR 5200 wide-area 3D measurement system

The Keyence VR 5200 wide-area 3D measurement system

Obtain quick 3D imaging and analysis with a non-contact measuring system. The post-processing analysis software offers highly accurate measurements of the scanned object's surface topology, roughness, contour, and form.

Features

Keyence VR5200

  • Wide area up to 200 mm x 100 mm stored in one 3D file.
  • Maximum sample height of 75 mm.
  • Maximum sample weight of 4.5 kg.
  • 0.1 µm resolution (height).
  • 0.4 µm repeatability (height).

Taylor Hobson CCI HD Optical Profiler

  • Single scan range in the z-direction of 2.2 mm.
  • Wide area up to 225 mm x 157 mm.
  • Maximum sample height of 40 mm.
  • Maximum sample weight of 10 kg.
  • Measure film thickness down to 50 nm.
  • 0.01 nm resolution over the entire measurement range.
  • 0.02 nm repeatability.

Application:

  • Geometrical measurements
  • Roughness measurement
  • 3D mapping of surface degradation
  • 3D scan of components

Working principle

Structured white light projects different interference fringe patterns onto the surface of the inspected object. The deformed fringe pattern corresponding with the object contour and the reflected light is captured by the camera. Based on the triangulation method, the 3D surface of the object can be reconstructed by the software.